| Selected Papers 1999-2004 |
6) Shot Noise in Linear Macroscopic Resistors
9) Avoiding Spuriouw Velocity Overshoots in
Hydrodinamic Simulations of Deep Submicron Devices by Physical
Modelling of Heat Transport
Semic.
Scie
Tech, 19 S142-144 (2004)
10) Non-Gaussian Resistance
Fluctuations in Disordered Materials
Proc. SPIE: Fluctuations and Noise , in press
C. Pennetta, E. Alfinito, L. Reggiani and S. Ruffo
11) Fluctuations of Complex Networks:
Electrical Properties of Single Protein nanodevices
(Invited
paper) Proc. SPIE: Fluctuations and Noise , in press
C. Pennetta, V. Akimov, E. Alfinito and L. Reggiani
1) Role of energy correlation on Coulomb
suppression
of shot noise in ballistic conductors contacted to
degenerate reservoirs
Phys.
Rev. B 68, 075309, 1-6 (2003)
T. Gonzalez, J. Mateos, D. Pardo, G. Gomila I.R.
Cantalapiedra
and
L. Reggiani
2) Upconversion of partition noise in
semiconductors
operating
under
periodic large-signal conditions
Phys.
Rev. B67, 165201 1-10 (2003)
P. Shiktorov, E. Starikov, V. Gruzinskis, L S. Perez,
T. Gonzalez,
L. Reggiani, L. Varani and J.C. Vaissiere
3) On the origin of shot noise in CdTe detectors
Appl.
Phys. Lett. 83, 2450 (2003)
G. Ferrari, M. Sampietro, G. Bertuccio, G. Gomila and
L. Reggiani
5) Giant suppression of shot noise in double
barrier resonant diode: a signature of coherent
transport
Semicond.
Sci. Tech. 18, L35 (2003)
V.Ya Aleshkin, L. Reggiani, N.V. Alkeev, V.E.
Lyunchenko,
C.N. Ironside,
J.M.L. Figuerido and C.R. Stanley
6) Monte Carlo Simulation of Threshold Bandwith
for
High Order Harmonics Extraction
IEEE-TED, 50, (5) 1171 (2003)
P. Shiktorov, E. Starikov, V. Gruzinskis, Reggiani, L.
Varani and J.C.
Vaissiere
7) Upconversion of intergroup hot-carrier noise
in
semiconductors
operating under periodic large-signal conditions
Fluctuation
Noise Lett. 3, L51, (2003)
P. Shiktorov, E. Starikov, V. Gru\v zinskis, L S.
P\'erez,
T. Gonz\'alez.
Reggiani, L. Varani and J.C. Vaissiere
8) Monte Carlo simulation of electromigration
phenomena
in
metallic lines
Mathematics and Computers in Simulation, 62,
495 (2003)
C. Pennetta, L. Reggiani and E. Alfinito
9) Unipolar transport and shot noise in
metal-semiconductor-metal
structures
J.
Appl. Phys., 93, 375-383 (2003)
G. Gomila I.R. Cantalapiedra and L. Reggiani
1) Effect of magnetic field quantization on the
shallow
acceptor spectrum in strained Ge/GeSi heterostructures
Phys.
Rev. B 66, 155336 (2002)
V. Ya. Aleshkin, V. I. Gavrilenko, D. B. Veksler, and
L. Reggiani
2) Semiclassical theory of shot noise in
ballistic
n(+)-i-n(+) semiconductor structures: Relevance of Pauli and long-range
Coulomb correlations
Phys
Rev B 66 (7): 075302 (2002)
Gomila G, Cantalapiedra IR, Gonzalez T, et al
3) Resistance and resistance fluctuations in
random
resistor networks under biased percolation
Phys.
Rev. E 65, 066119 (2002)
C. Pennetta, L. Reggiani, Gy. Trefán, and E.
Alfinito
4) Resistance noise near to electrical
breakdown:
steady state of random networks as a function of the bias
FNL
2(1) R29 (2002)
C. Pennetta
5) Monte Carlo calculation of electronic noise
under
high-order harmonic generation
Appl
Phys Lett 80 (25): 4759 (2002)
Shiktorov P, Starikov E, Gruzinskis V, et al.
6) Stationary regime of random resistor
networks
under biased percolation
J
Phys C 14 (9): 2371(2002)
C. Pennetta, L. Reggiani, E. Alfinito and Gy. Trefan
7) On topological defect formation in the
process
of symmetry breaking phase transitions,
Mod.Phys.Lett. B16 (4), 93 2002
E. Alfinito, O. Romei and G. Vitiello
8)Domain formation in non-istantaneous
breaking
phase transitions,
Phys
Rev B 65 (5): art. no. 054105 (2002)
E. Alfinito, and G. Vitiello
9) Monte Carlo calculations of THz generation
in
nitrides
Phys Status Solidi A 190 (1): 247 ( 2002)
Varani L, Vaissiere JC, Starikov E, et al.
1) Scaling and Universality of Resistance
Noise
near to Electrical Breakdown,
(invited paper) in print on
Proc.
of the 16th International Conference on Noise in Physical Systems and
1/f
Fluctuations,
Gainesville, Florida, October 2001.
C. Pennetta
2) A percolative approach to electromigration of
metallic
lines,
J.
Phys. D: Applied Physics,34,1421,2001
C. Pennetta, L. Reggiani, G. Trefan, F. Fantini, A.
Scorzoni,
I. De Munari
3) Transfer-field methods for electronic
noise
in
submicron semiconductor structures
Riv Nuovo Cimento 24 (9): 1 (2001)
Shiktorov P, Starikov E, Gruzinskis V, et al.
4) Electron transport and shot noise in
double-barrier
resonant diodes: The role of Pauli and Coulomb correlations
Phys
Rev B 64 (24): art. no. 245333 ( 2001)
Aleshkin VY, Reggiani L
5) N-type negative differential conductance
in
quasiballistic
single-barrier heterostructures
J
Appl Phys 90 (8): 3979 ( 2001)
Aleshkin VY, Reggiani L, Reklaitis A
6) Monte Carlo simulation of terahertz
generation
in nitrides
J
Phys C 13 (32): 7159 ( 2001)
Starikov E, Shiktorov P, Gruzinskis V, et al.
7) Fractional exclusion statistics and shot
noise
in ballistic conductors
Phys
Rev B 63 (16): art. no. 165404 (2001)
Gomila G, Reggiani L
8) On reverse concatenation and soft
decoding
algorithms
for PRML magnetic recording channels
IEEE J Sel Area Comm 19 (4): 612 (2001)
Reggiani L, Tartara G
9) Electron transport and shot noise
in
ultrashort
single-barrier semiconductor heterostructures Phys
Rev B 63 (8): art. no. 085302 ( 2001)
Aleshkin VY, Reggiani L, Reklaitis A
10) Monte Carlo simulation of THz maser
based
on
optical phonon transit time resonance in GaN
IEEE T ELECTRON DEV 48 (3): 438 (2001)
Starikov E, Shiktorov P, Gruzinskis V, et al.
12)
Fractional
exclusion statistics and shot noise in ballistic conductors,
Phys.
Rev. B63, 165404
1-6 (2001)
G. Gomila and L. Reggiani
Current instability and shot noise in
nanometric
semiconductor heterostructures NANOTECHNOLOGY 11 (4): 370-374 DEC
2000
Aleshkin VY, Reggiani L, Reklaitis A
Shot-noise suppression in Schottky barrier
diodes,
J.
Appl. Phys. 88, 3079 (2000)
G. Gomila, L. Reggiani and J.M. Rubi
Maximum Entropy Principle within a total
energy
scheme for hot carriers in
Semiconductors,
Phys.
Rev. B61, 16667 (2000)
M. Trovato and L. Reggiani
A Percolative Approach to Reliability of
Thin
Films,
IEEE Trans. on
Electronic
Devices 47, 1986, 2000
C. Pennetta, L. Reggiani and G. Trefan
Anomalous crossover between thermal and
shot
noise in macroscopic diffusive conductors,
Phys.
Rev. 62, 8068 (2000)
G. Gomila and L. Reggiani
Enhanced shot noise from tunneling and
space-charge
positive feedback,
Phys.
Rev. B62, 16773 (2000)
A. Reklaitis and L. Reggiani
Scaling and Universality in Electrical
Failure
of Thin Films,
Phys.
Rev. Lett., 84, 5006, 2000
C. Pennetta, L. Reggiani and G. Trefan
Scaling Law of Resistance Fluctuations in
Stationary
Random Resistor Networks,
Phys.
Rev.Lett., 85, 5238, 2000
C. Pennetta, L. Reggiani and G. Trefan
Reply on Comment: Universality of the 1/3
shot-noise
suppression factor in nondegenerate diffusive conductors,
Phys.
Rev. Lett., 83, 1267 (1999)
T. Gonzalez, C. Gonzalez, J. Mateos, D. Pardo, L.
Reggiani,
O.M. Bulashenko and J.M. Rubi
Monte Carlo study of shot-noise suppression
in
semiconductor heterostructure diodes,
Phys.Rev.
B60,11683 (1999)
A. Reklaitis and L. Reggiani
Microscopic analysis of shot-noise
suppression
in nondegenerate diffusive conductors,
Phys.
Rev. B 60, 2670 (1999)
T. Gonzalez, J. Mateos, D. Pardo, O.M. Bulashenko and
L. Reggiani
Spatio-temporal correlation of conduction
current
fluctuations within a hydrodynamic-Langevin scheme,
Appl.
Phys. Lett. 74, 723 (1999)
P. Shiktorov, E. Starikov, V. Gruzinskis, T. Gonzalez,
J. Mateos, D. Pardo, L. Reggiani, L. Varani, J.C. Vaissiere and J.P.
Nougier
Maximum Entropy Principle for Hydrodynamic
Transport
in Semiconductor Devices,
J.
Appl. Phys.85, 4050 (1999)
M. Trovato and L. Reggiani
Maximum Entropy Principle for Nonparabolic
Hydrodynamic
Transport in Semiconductor Devices
J.
Appl. Phys., 86, 5906 (1999)
M. Trovato, P. Falsaperla and L. Reggiani
Effects of the epitaxial layer thichness on
the
noise properties of Schottky barrier diodes
J.
Appl, Phys. 86, 1004 (1999)
G. Gomila and O.M. Bulashenko
Anisotropy of thermal conductivity and
energy-flux
relaxation time of hot electrons in semiconductors,
J.
Appl. Phys. 85, 1572 (1999)
R. Brunetti, P. Golinelli, M. Rudan and L. Reggiani
Unified
interpretation
of the fundamental units of electrical and thermal conductance'' in:
Highlights
1996/1997 INFM Report (M. Airoldi and F. Gorini
Edts.,
Microart's, Recco (Ge) Italy, pp 51-52 (1999))
L. Reggiani
Thermal effects on the electrical
degradation
of thin film resistors,
Phyisica
A, 266, 214, 1999
C.Pennetta, L Reggiani, L.B.Kiss
Excess Thermal-Noise in the Electrical
Breakdown
of Random Resistor Networks,
Europ. Phys. J. B12, 61, 1999
C. Pennetta, L. B. Kiss, Z. Gingl and L. Reggiani
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